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NSG 5070 - inductive switching transient test circuit for ES-XW7T-1A278-AC

August 2005

Designed in accordance with ES-XW7T-1A278-AC for test pulses A, B, C and F using an inductive/relay transient generator, the basic philosophy of this test circuit is better reproducibility of actual switching transients. In an interesting variation from traditional pulse generation, the reproducibility of this test circuit comes not from the output characteristics as in historical conducted automotive immunity tests, but from a fixed design of the generator using several pre-defined components.

 

This stand-alone device can be used independently of other generators, enabling users of competitive immunity test solutions to have standard coverage that others lack.

 

tim.horacek@teseq.com

 

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